| Autor(i): | Sullivan, Harold J. |
| Naslov: | SEMICONDUCTOR Reliability : Based on the Conference on Reliability of Semiconductors Devices, Advisory Group on electron Tubes, Departments on Defense / Edited by John E. Shwop, Harold J. Sullivan |
| Impresum: | Elizabeth, New Jersey : Engineering Publishers , cop.1961 |
| Materijalni opis: | IX; 309 str : ilustr. ; 23 cm |
| Jezik: | Engleski |
| Napomena: | Bibliografija uz svaki rad |
| Ključne riječi: | semiconductors - reliability * poluvodiči |
| Ostali autori / urednici: | Shwop, John E. |
| Podaci o fondu: | KONČAR-INDOK |
| Signatura: | III/3895 -1 |
| Inventarni broj: | 7922 |
| Vrsta građe: | knjiga |
| Knjižnica: | KONČAR - institut za elektrotehniku, INDOK, http://www.koncar-institut.hr/sadrzaj.as... |
| MFN: | 4889 |
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| Autor: | Shwop, John E. |
| Naslov: | Semiconductor Reliability. / Shwop J.E. ; ed.by Shwop J.E. and Sullivan H.J. |
| Impresum: | New York : Reinhold Publishing Corp. , 1961 |
| Materijalni opisi: | IX+ 309 str. : sa sl.,tabl. ; v8 0 |
| Napomena: | Based on the Conference on Reliability of Semiconductor Devices 1961,sponsored by The Working Group on Semiconductor Devices,Advisory Group on electron Tubes,Department of Defence. |
| Signatura: | 111 |
| ID: | 980915016 |
| Format: | Tiskana građa |
| Knjižnica: | Fakultet elektrotehnike, strojarstva i brodogradnje Split, http://www.fesb.hr/fesb/bib/bibli.htm |
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